Tag: testing
Questions Related to testing
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IEEE829
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IEEE827
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BS7925-1
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BS7925-2
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Faults in program specifications are the most expensive to fix.
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Faults in code are the most expensive to fix
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Faults in requirements are the most expensive to fix
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Faults in designs are the most expensive to fix
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Design based
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Big-bang
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Bottom-up
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Top-down
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Static
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Tertiary
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Dynamic
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Both 1 and 3
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Dynamic DP
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Static DP
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None of the above
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Both 1 and 2
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Programmatic descriptions for parent object and the child object is referred in Object Repository
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Programmatic descriptions for both parent object and the child objects
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Parent object is referred in Object Repository and the programmatic descriptions for child object
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None of the above
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We can assign the object to a variable
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We can use With and End with statements
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We should use them every time
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None of the above
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Dynamic
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Tertiary
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Static
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Both 1 and 3
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Property Object
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Property Name
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Property Value
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Dynamic Property
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Set
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Property Object
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Count
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ChildObjects