Multiple choice general knowledge science & technology

The M-system and E-system in metrology are related with measurement of

  1. a)gears

  2. b)screw threads

  3. c)flatness

  4. d)surface finish
Reveal answer Fill a bubble to check yourself
D Correct answer
Explanation

The M-system (mean line system) and E-system (envelope system) are two methods for assessing surface finish in metrology. M-system uses mean line as reference, while E-system uses envelope of surface peaks. They quantify roughness, waviness, and other surface texture parameters.

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